Newsgroups: comp.sys.transputer
From: mcwill@duckend.demon.co.uk (Iain McWilliams)
Subject: Re: T801 availability
Organization: LMP Ltd.
Date: Fri, 25 Nov 1994 07:10:33 +0000
Message-ID: <216688317wnr@duckend.demon.co.uk>

In article: <785576241snz@walker.demon.co.uk>  paul@walker.demon.co.uk 
(Paul Walker) writes:
> It is often rather difficult to design a device test program which is
> as rigorous as a few seconds of system test on a PCB with RAM and
> peripherals. On a number of occasions, board testing showed up faults
> in transputer silicon, and the results were fed back to improve the 
> silicon test. 

What you forgot to mention Paul, was that said B016 was normally run 
inside an oven at Gas Mark 4 :-), 90C for those of you with leccy.


Iain McWilliams                       mcwill@duckend.demon.co.uk


